Testing Service

Sunny Cal Tech offers wafer testing service for both HBT and HEMT in either die or wafer form. This service provides industry standard WAT database for all our customers, as well as a PCM database for SPC analysis in conjunction. The CIM system will generate a report that shows whether or not the processed wafer has met shipping standards.

　　In-house wafer testing service is available from WIN for both HBT and HEMT products. The service provides standard WAT database for all customers, and offers PCM database for SPC analysis in parallel. The real time yield report generated by CIM system automatically judges if processed wafer has met shipping criteria.

　　WIN also provides probe card making service and offers on-wafer DC/RF screening depending on specific request. The proprietary design of our probe card offers the best quality to meet customers' requirements. The available DC/RF screening service so far includes:

　　DC single and multiple site parallel probing. (Max is hex-site X16)

　　High current (1A) measurement

　　Insertion loss and Harmonic testing

　　4 Ports Vector S-parameters testing : Single-ended / Differential

　　Fixed or Sweep RF power testing : Gain, P1dB, Psat, etc.

　　RF high input power testing : > +10 dBm

　　CW / Pulse testing

　　Other testing